Dark-field X-ray microscopy

Dark-field X-ray microscopy (DFXM^[1] or DFXRM^[2]) is an imaging technique used for multiscale structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction-based imaging. The technique works by using scattered X-rays to create a high degree of contrast, and by measuring the intensity and spatial distribution of the diffracted beams, it is possible to obtain a three-dimensional map of the sample's structure, orientation, and local strain.

^ Simons, H.; King, A.; Ludwig, W.; Detlefs, C.; Pantleon, W.; Schmidt, S.; Stöhr, F.; Snigireva, I.; Snigirev, A.; Poulsen, H. F. (14 January 2015). "Dark-field X-ray microscopy for multiscale structural characterization". Nature Communications. 6 (1): 6098. Bibcode:2015NatCo...6.6098S. doi:10.1038/ncomms7098. ISSN 2041-1723. PMC 4354092. PMID 25586429. This article incorporates text from this source, which is available under the CC BY 4.0 license.
^ Simons, Hugh; Ahl, Sonja Rosenlund; Jakobsen, Anders Clemen; Yildirim, Can; Cook, Phil K.; Detlefs, Carsten; Poulsen, Henning Friis (1 August 2018). "Multi-Scale 3D Imaging of Strain and Structure with Dark-Field X-Ray Microscopy". Microscopy and Microanalysis. 24 (S2): 72–75. Bibcode:2018MiMic..24S..72S. doi:10.1017/s1431927618012758. ISSN 1431-9276. S2CID 139864737.

[:1-1] Simons, H.; King, A.; Ludwig, W.; Detlefs, C.; Pantleon, W.; Schmidt, S.; Stöhr, F.; Snigireva, I.; Snigirev, A.; Poulsen, H. F. (14 January 2015). "Dark-field X-ray microscopy for multiscale structural characterization". Nature Communications. 6 (1): 6098. Bibcode:2015NatCo...6.6098S. doi:10.1038/ncomms7098. ISSN 2041-1723. PMC 4354092. PMID 25586429. This article incorporates text from this source, which is available under the CC BY 4.0 license.

[:2-2] Simons, Hugh; Ahl, Sonja Rosenlund; Jakobsen, Anders Clemen; Yildirim, Can; Cook, Phil K.; Detlefs, Carsten; Poulsen, Henning Friis (1 August 2018). "Multi-Scale 3D Imaging of Strain and Structure with Dark-Field X-Ray Microscopy". Microscopy and Microanalysis. 24 (S2): 72–75. Bibcode:2018MiMic..24S..72S. doi:10.1017/s1431927618012758. ISSN 1431-9276. S2CID 139864737.

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