Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction. MFM scanning often uses non-contact atomic force microscopy (NC-AFM) and is considered to be non-destructive with respect to the test sample. In MFM, the test sample(s) do not need to be electrically conductive to be imaged.