X-ray standing waves

The X-ray standing wave (XSW) technique can be used to study the structure of surfaces and interfaces with high spatial resolution and chemical selectivity. Pioneered by B.W. Batterman in the 1960s,[1] the availability of synchrotron light has stimulated the application of this interferometric technique to a wide range of problems in surface science.[2][3]

  1. ^ B. W. Batterman and H. Cole (1964). "Dynamical Diffraction of X Rays by Perfect Crystals". Reviews of Modern Physics. 36 (3): 681. doi:10.1103/RevModPhys.36.681.
  2. ^ J. Zegenhagen (1993). "Surface structure determination with X-ray standing waves". Surface Science Reports. 18 (7/8): 202–271. doi:10.1016/0167-5729(93)90025-K.
  3. ^ D. P. Woodruff (2005). "Surface structure determination using x-ray standing waves". Reports on Progress in Physics. 68 (4): 743. doi:10.1088/0034-4885/68/4/R01. S2CID 122085105.