Anodic bonding

Anodic bonding is a wafer bonding process to seal glass to either silicon or metal without introducing an intermediate layer; it is commonly used to seal glass to silicon wafers in electronics and microfluidics. This bonding technique, also known as field assisted bonding or electrostatic sealing,[1] is mostly used for connecting silicon/glass and metal/glass through electric fields. The requirements for anodic bonding are clean and even wafer surfaces and atomic contact between the bonding substrates through a sufficiently powerful electrostatic field. Also necessary is the use of borosilicate glass containing a high concentration of alkali ions. The coefficient of thermal expansion (CTE) of the processed glass needs to be similar to those of the bonding partner.[2]

Anodic bonding can be applied with glass wafers at temperatures of 250 to 400 °C or with sputtered glass at 400 °C.[3] Structured borosilicate glass layers may also be deposited by plasma-assisted e-beam evaporation.[4]

This procedure is mostly used for hermetic encapsulation of micro-mechanical silicon elements. The glass substrate encapsulation protects from environmental influences, e.g. humidity or contamination.[2] Further, other materials are used for anodic bonding with silicon, i.e. low-temperature cofired ceramics (LTCC).[5]

  1. ^ Cite error: The named reference WP1969 was invoked but never defined (see the help page).
  2. ^ a b Cite error: The named reference WFG2003 was invoked but never defined (see the help page).
  3. ^ Cite error: The named reference GMS+1999 was invoked but never defined (see the help page).
  4. ^ Cite error: The named reference LHM+2010 was invoked but never defined (see the help page).
  5. ^ Cite error: The named reference KGH+2010 was invoked but never defined (see the help page).