Field-emission microscopy

Field-emission microscopy (FEM) is an analytical technique that is used in materials science to study the surfaces of needle apexes.[1][2] The FEM was invented by Erwin Wilhelm Müller in 1936,[3] and it was one of the first surface-analysis instruments that could approach near-atomic resolution.

  1. ^ "Intro to Field Emission". Field Emission / Ion Microscopy Laboratory, Purdue University, Dept. of Physics. Archived from the original on 2007-05-03. Retrieved 2007-05-10.
  2. ^ Field Emissions and Field Ionization.
  3. ^ Müller, Erwin W. (November 1936). "Die Abhängigkeit der Feldelektronenemission von der Austrittsarbeit". Zeitschrift für Physik (in German). 102 (11–12): 734–761. doi:10.1007/BF01338540. ISSN 1434-6001.