Floating-gate MOSFET

The floating-gate MOSFET (FGMOS), also known as a floating-gate MOS transistor or floating-gate transistor, is a type of metal–oxide–semiconductor field-effect transistor (MOSFET) where the gate is electrically isolated, creating a floating node in direct current, and a number of secondary gates or inputs are deposited above the floating gate (FG) and are electrically isolated from it. These inputs are only capacitively connected to the FG. Since the FG is surrounded by highly resistive material, the charge contained in it remains unchanged for long periods[1] of time, typically longer than 10 years in modern devices. Usually Fowler-Nordheim tunneling or hot-carrier injection mechanisms are used to modify the amount of charge stored in the FG.

The FGMOS is commonly used as a floating-gate memory cell, the digital storage element in EPROM, EEPROM and flash memory technologies. Other uses of the FGMOS include a neuronal computational element in neural networks,[2][3] analog storage element,[2] digital potentiometers and single-transistor DACs.

  1. ^ "Tunneling: New Floating Gate Memory with Excellent Retention Characteristics". doi:10.1002/aelm.201800726. S2CID 139369906. {{cite journal}}: Cite journal requires |journal= (help)
  2. ^ a b Cite error: The named reference Mead was invoked but never defined (see the help page).
  3. ^ Cite error: The named reference Holler was invoked but never defined (see the help page).