ISO/IEC JTC 1/SC 42

ISO/IEC JTC 1/SC 42 Artificial Intelligence is a standardization subcommittee of the Joint Technical Committee ISO/IEC JTC 1 of the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC).[1] ISO/IEC JTC 1/SC 42 develops and facilitates the development of international standards, technical reports, and technical specifications within the fields of Artificial Intelligence (AI).[2] The international secretariat of ISO/IEC JTC 1/SC 42 is the American National Standards Institute (ANSI), located in the United States of America. The Chair of SC 42 is Wael William Diab.[3] The first meeting of the committee took place in Beijing, China in April 2018.[4] SC 42 meets face-to-face twice a year in an opening and closing plenary format with its subgroups meeting concurrently during the week. SC 42 organizes bi-annual AI workshops that target all stakeholders interested in AI and the committee's work.[5]

ISO/IEC JTC 1/SC 42 — Artificial Intelligence
Formation2018
TypeStandards organization
PurposeDevelopment of worldwide standards for artificial intelligence
Region served
Worldwide
Chair
Wael William Diab[6]
Committee Manager
Heather Benko[7]
Parent organization
International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) JTC 1
Websitejtc1info.org/technology/subcommittees/ai/
  1. ^ "Strengthening international cooperation on artificial intelligence". www.brookings.edu/. Retrieved 2023-04-25.
  2. ^ "Enabling the digital transformation of industry: The roles of AI, big data, analytics, and related data ecosystem". www.raps.org/. Retrieved 2023-04-24.
  3. ^ "ISO/IEC JTC 1/ SC 42". www.iec.ch. Retrieved 2023-04-24.
  4. ^ "First International Standards committee for entire AI ecosystem | IEC e-tech | Issue' 03/2018". IEC e-tech. Retrieved 2018-08-23.
  5. ^ "ISO/IEC AI Workshops". jtc1info.org. Retrieved 2023-04-24.
  6. ^ "Wael William Diab". www.itu.int. Retrieved 2023-06-06.
  7. ^ "ISO/IEC JTC 1/ SC 42". www.iso.org. Retrieved 2023-04-24.